Scan-Line Drift — Ridged
2026 · 7×7 in · 0.5 mm pen

Scan-line drift fused with ridged fBm. The mask uses (1 − |noise|)^sharpness per octave — high values cluster along the zero-crossings of the field, forming thin branching ridge lines. Lines snap at those ridges: sharp vein-like bursts rather than blobs. sharpness controls edge width; threshold controls how many ridges trigger a drift. Click to regenerate.